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| Test
Engineering diversifiedsystems' extensive testing capabilities complement our state-of-the-art manufacturing facility, providing a complete EMS solution. Since we offer a full range of test engineering services, we can provide the most economical and comprehensive test strategy for your product. Starting in the product design phase and continuing throughout your product's life cycle, dsi can tailor test strategies and technical support as product requirements change and technological advances transform the functional and physical makeup of your product. |
Testing During the Product Prototype Phase As your product is being developed, we can provide test services that can result in lower costs as the product moves to the production phase. We can perform a comprehensive Design For Testability (DFT) review during the prototype stage and assure that all design considerations for testability have been reviewed and implemented where possible. dsi works with your design engineers to develop test specifications that address the specific design verification/performance requirements that will provide maximum fault detection yet be economical in implementation. |
| For prototype testing, we offer specific functions tailored to our customer's needs and timeline demands. Product verification can be accomplished using functional test methods and in-circuit testing (ICT). Traditional ICT testing, while very inclusive, has longer lead times and fixture costs, factors that are not desirable for fast-turn schedules and evolving product designs. dsi offers an effective ICT alternative -- a Flying Probe Tester (FPT), which eliminates fixturing and reduces test development schedules. Since many new products have embedded software/firmware, we can provide In-System-Programming (ISP) for products with flash memories, PLDs or FPGAs. |
| FPT - The Flying Probe Test solution is a great ICT alternative for fast-turn or small lot/high mix product groups. Since the FPT is software driven and no fixturing is required, product engineering changes are easily incorporated. |
Boundary Scan Testing In addition, dsi has the capability to perform JTAG Boundary Scan testing with our HP3070 in circuit testors (performed in conjunction with in-circuit nodes). |
| JTAG,
an acronym for Joint Test Action Group, is the usual name used for the IEEE 1149.1
standard entitled Standard Test Access Port and Boundary-Scan Architecture for test
access ports used for testing printed circuit boards using boundary scan. JTAG was standardized in 1990 as the IEEE Std. 1149.1-1990. In 1994, a supplement that contains a description of the boundary scan description language (BSDL) was added. Since then, this standard has been adopted by electronics companies all over the world. Boundary-scan is nowadays mostly synonymous with JTAG. While designed for printed circuit boards, it is nowadays primarily used for testing sub-blocks of integrated circuits, and is also useful as a mechanism for debugging embedded systems, providing a convenient "back door" into the system. When used as a debugging tool, an in-circuit emulator which in turn uses JTAG as the transport mechanism enables a programmer to access an on-chip debug module which is integrated into the CPU via JTAG. The debug module enables the programmer to debug the software of an embedded system. |
dsi offers a wide variety of services to support continuing manufacturing requirements and specific customer needs. Please contact us to discuss your options for rapid testing. |
